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Tony Beddard

Chief Technical Officer

Tony brings over 25 years’ experience in R&D, Semiconductor Metrology, Operations, M&A, business development, and advanced technology development within global cutting edge Semiconductor companies.

Tony led the global optical metrology Research and Development systems with such partners as INTEL, SAMSUNG, TSMC, SANDISK and TOSHIBA in both logic and memory devices, collaborating with all next generation technologies research and volume manufacturing implementation, as well as inline metrology for solar high volume manufacturing.


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